High Resolution X-Ray Diffractometry And Topography
D.K. Bowen,Brian K. Tanner | 1998-02-05 00:00:00 | CRC Press | 264 | Engineering
The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research.
Reviews
This is a new generation book. Most books available in the field cover the whole history of the X-ray scattering theories and applications. Then, specific applications that are very important in our days for industries and scientific researches are not properly treated. This book does begin where other related books have finished. The issues covered are not found anywhere else together, in a same volume, as they are here. It is fundamental to the new era of materials characterization.
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